SNE-3200M Tabletop SEM
Mid-Range Tabletop SEM
A compact Tabletop SEM with 3-axis stage control and dual imaging detectors (SE/BSE) standard. Low vacuum capability for non-conductive samples is included. The SNE-3200 series Tabletop SEM matches or exceeds the imaging capabilities of all other tabletop SEM’s available with the exception of the SNE-4500M and SNE-4500M Plus. Additional features such as variable spot size control allow for the most flexible imaging as well as optimal x-ray generation for EDS analysis. The SNE-3200M comes standard with both Backscatter (BSE) and a true Everhart-Thornley Secondary Electron (SE) detector.
The SNE-3200M is a versatile microscope that can be easily used for Quality Control workflows, Engineering staff and even in Educational environments due to its robust design and easy to learn and use software.
Optionally, the SNE-3200M can be delivered with some features eliminated, making the SNE-3200M the most affordable SEM on the market.
Advanced options available:
EDS Elemental Analysis – Cooling Stage – Anti-Vibration table
Imaging Performance
RESOLUTION
15NM
MAGNIFICATION (LIVE)
60,000x
MULTI DETECTORS
SE / BSE
BEAM ENERGY
1-30 kV
SE (Secondary Electron) Imaging
Capture images with surface and topographic details
BSE (Back-Scattered Electron) Imaging
Capture images with material composition information (Atomic Weight Contrast imaging)
Convenience and Ease of Use
STAGE SYSTEM
X,Y,R (3-axis) – standard
X,Y,T (3-axis) – optional
Beam Shift:15μm
AUTO SETTING
Start (Filament Saturation)
Focus / Stigmator
Brightness / Contrast
VIEWING MODES
Secondary Electron (SE)
Backscatter Electron (BSE)
Dual View SE/BSE Multi Display
Convenient specimen postioning is achieved via movement of the manual 3-axis stage. A wide variety of sample holders are available to accommodate any type of sample. The software offers the novice user a simple and clean interface free of clutter while the more advanced user can easily access features allowing further control of the microscope functions.
With the intuitive software, users are able to view and save either SE and BSE images or as a composite image combining both SE+BSE as shown below. This composite image provides a great tool for investigative analysis by offering both topographical (SE) and composition (BSE) information in one single image.
In addition, the software allows viewing both SE and BSE images in a side-by-side or Dual View mode.
Specifications for SNE-3200M
| ELECTRON BEAM SYSTEM | |
|---|---|
| RESOLUTION | 15nm (30kv, SE Image) 20nm (30kv, BSE Image) |
| ACCELERATING VOLTAGE | 1~30kV (1/5/10/15/20/30) |
| DETECTOR | Secondary Electron Image(SE) Backscattered Electron Image(BSE) 4 Quadrant BSE - full on/off control |
| ELECTRON GUN | Pre-centered Tungsten Filament Cartridge |
| IMAGING FEATURES | |
|---|---|
| AUTOMATIC FUNCTIONS | Auto Start Auto Focus Auto Stigmator Auto Contrast & Brightness |
| MAGNIFICATION (LIVE) | 20X~60,000X |
| MAGNIFICATION (SAVED) | > 500,000X (theoretical - see explanation in FAQ) |
| IMAGE CAPTURE SIZES | 5120 x 3840 2560 x 1920 1280 x 960 640 x 480 320 x 240 |
| IMAGE FORMATS | BMP, JPEG, PNG, TIFF |
| IMAGE ANNOTATION | 2-Point Length Multi-Point Length Angle Measurement Diameter Measurement Area Measurements Arrow/Rectangle Marking Text Annotations |
| VACUUM SYSTEM | |
|---|---|
| VACUUM MODES | High & Low Vacuum (Charge Reduction) |
| ROUGHING VACUUM PUMP | Rotary Vane Pump (standard) |
| HIGH VACUUM PUMP | Pfeiffer HiPace Turbo Molecular Pump |
| DIMENSIONS | |
|---|---|
| MAIN UNIT | 390(W) x 380(D) x 560(H)mm, 83kg |
| CONTROLLER UNIT | 390(W) x 325(D) x 560(H)mm, 37kg |
| STAGE SYSTEM | |
|---|---|
| AUTOMATIC FUNCTIONS | 3-axis System (X, Y, R - Manual) X, Y-axis : ±35mm R-axis : 360° * Image Shift : ±150μm * T-axis : 0 to 45˚ (Optional - replaces R-axis) |
| MAXIMUM SAMPLE SIZE | 70mm in Diameter x 30mm in Height |